| Reference |
J.F. van der Veen, R. van Silfhout and A.W. Denier van der Gon: Ion and X-ray scattering studies of surface disorder In: Ordering at Surface and Interfaces : Proceedings of the Third NEC Symposium, Hakone, Japan, October 7-11, 1990 /ed. A. Yoshimori, T. Shinjo and H. Watanabe, Springer-Verlag, 1992. - pp. 3-12 |
