Influence of highly charged impurities on ion temperatures measured with active-beam plasma diagnostics Back to all publications Publication date 1 January 1987 Reference A.J.H. Donn and F.J. de Heer, Influence of highly charged impurities on ion temperatures measured with active-beam plasma diagnostics, J. Appl. Phys. 62, 780-786 (1987) Request this article
