High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem Back to all publications Publication date 1 January 1985 Reference E.J. van Loenen, A.E.M.J. Fischer, J.F. van der Veen and F.K. LeGoues, High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem, Surf. Sci. 154, 52-69 (1985)
