Formation of the Ni-SiC(001) interface studied by high-resolution ion backscattering Back to all publications Publication date 1 January 1989 Reference W.F.J. Slijkerman, A.E.M.J. Fischer, J.F. van der Veen, I. Ohdomari, S. Yoshida and S. Misawa, Formation of the Ni-SiC(001) interface studied by high-resolution ion backscattering, J. Appl. Phys. 66, 666-673 (1989) Request this article
