Epitaxial growth of Si on GaP(100) and Si(111), monitored by soft X-ray reflection Back to all publications Publication date 1 January 1985 Reference M.P. Bruijn, H.G. Muller, J. Verhoeven and M.J. van der Wiel, Epitaxial growth of Si on GaP(100) and Si(111), monitored by soft X-ray reflection, Surf. Sci. 154, 601-613 (1985) Request this article
