Determination of the atomic structure of the epitaxial CoSi2:Si (111) interface using high-resolution Rutherford backscattering Back to all publications Publication date 1 January 1988 Reference A.E.M.J. Fischer, T. Gustafsson and J.F. van der Veen, Determination of the atomic structure of the epitaxial CoSi2:Si (111) interface using high-resolution Rutherford backscattering, Phys. Rev. B 37, 6305-6310 (1988) Request this article
