Defects in amorphous silicon probed by subpicosecond photocarrier dynamics Back to all publications Publication date 1 January 1992 Reference P.A. Stolk, L. Calcagnile, S. Roorda, W.C. Sinke, A. Berntsen and W.F. van der Weg, Defects in amorphous silicon probed by subpicosecond photocarrier dynamics, Appl. Phys. Lett. 60, 1688-1690 (1992) Request this article
