Combined (1X2) ® (1X1) transition and atomic roughening of Ge(001) studied with surface x-ray diffraction

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Reference A.D. Johnson, C. Norris, J.W.M. Frenken, H.S. Derbyshire, J.E. MacDonald, R. van Silfhout and J.F. van der Veen, Combined (1X2) ® (1X1) transition and atomic roughening of Ge(001) studied with surface x-ray diffraction, Phys. Rev. B 44, (3), 1134-1138 (1991)