Characterization of ultrathin nickel layers on Si(111) using RHEED and RBS Back to all publications Publication date 1 January 1986 Reference A.E.M.J. Fischer, P.M.J. Marée and J.F. van der Veen, Characterization of ultrathin nickel layers on Si(111) using RHEED and RBS, Appl. Surf. Sci. 27, 143-150 (1986)
