Characterization of a multilayer coated laminar reflection grating at l = 0.154 nm Back to all publications Publication date 1 January 1991 Reference E.J. Puik, M.J. van der Wiel, P. Lambooy, J. Verhoeven, F.E. Christensen and H.A. Padmore, Characterization of a multilayer coated laminar reflection grating at l = 0.154 nm, J. X-Ray Sci. Technol. 3, 19-34 (1991) Request this article
