Atomic spectroscopy as a diagnostic tool in ion-beam contamination problems Back to all publications Publication date 1 January 1974 Reference S. Doorn, C. Foster, T.P. Hoogkamer, H. Roukens and F.W. Saris, Atomic spectroscopy as a diagnostic tool in ion-beam contamination problems, Nucl. Instrum. Methods 120, 371-373 (1974) Request this article
