Absolute emission cross sections for the calibration of optical detection systems in the 120-250 nm range

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Reference H.A. van Sprang, H.H. Brongersma and F.J. de Heer, Absolute emission cross sections for the calibration of optical detection systems in the 120-250 nm range, Chem. Phys. Lett. 65, 55-60 (1979)