Dr. Jessica Boland (University of Manchester) 

Main speaker

• Speaker: Dr. Jessica Boland (University of Manchester) 

Introductory speaker

• Speaker: Daphne Dekker
• Title: Exploring the nanoscale: Mapping the optoelectronic properties of advanced functional nanomaterials to inform device design.

Abstract

Advanced functional materials, such as topological quantum materials and III-V nanoparticles, are essential for the development of ‘next-generation’ devices that will support the  ‘technologies of the tomorrow’. For example, topological insulators have many  advantageous properties, such as intrinsic high electron mobility and spin-momentum locking, which render them useful for spintronic and quantum devices. Whereas, semiconductor nanoparticles have the potential to act as single photon emitters in telecommunication systems. However, device development of these materials has been hindered by a lack of understanding and control of their optoelectronic properties at the nanoscale. Here, we present scattering-type scanning near-field optical microscopy (s-SNOM) as a powerful tool for characterising material properties on nanometre length scales. We present examples of its application in the visible, midinfrared and terahertz range. Examples include: identification of surface chemical composition in individual indium nanoparticles via room-temperature nano-FTIR spectroscopy;  local mapping of ion implanted regions in silicon and silicon carbide for quantum applications; and  probing the conductivity of the surface state of topological insulator bismuth telluride thin films via cryogenic near-field THz spectroscopy.

Contact

Erik Garnett – E.Garnett@amolf.nl