| Reference |
E. Vlieg, I.K. Robinson and J.F. van der Veen: X-ray diffraction from surfaces and interfaces: Atomic structure and morphology In: Advances in Surface and Thin Film Diffraction : Symposium held in November 27-29, 1990, Boston, Massachusetts, U.S.A. /ed. T.C. Huang, P.I. Cohen and D.J. Eaglesham, Material Research Society, 1991. - pp. 169-177 |
