| Reference |
S. Roorda, R.A. Hakvoort, A. van Veen, P.A. Stolk and F.W. Saris: Vacancy-type and electrical defects in amorphous silicon probed by positrons and electrons In: Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. /ed. G.S. Was, L.E. Rehn and D.M. Follstaedt, Materials Research Society, 1992. - pp. 39-44 |
