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Summary of the workshop on fundamentals and applications in Fourier transform ion cyclotron resonance mass spectrometry

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Reference R.M.A. Heeren: Summary of the workshop on fundamentals and applications in Fourier transform ion cyclotron resonance mass spectrometry In: Fundamentals and Applications of Gas Phase Ion Chemistry /ed. K.R. Jennings, Kluwer, 1999.

This workshop was intended to discuss some of the recent developments in FT-ICRMS and discuss their relevance to various fundamental and practical aspects of mass spectrometry.

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Visiting address

  • Science Park 104
  • 1098 XG Amsterdam
  • The Netherlands

Delivery address

  • Science Park 102
  • 1098 XG Amsterdam
  • The Netherlands

Mail address

  • P.O. Box 41883
  • 1009 DB Amsterdam
  • The Netherlands

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