| Reference |
J. Vrijmoeth, P.M. Zagwijn, J.W.M. Frenken and J.F. van der Veen: Structure determination of the NiSi2(111) surface using medium energy ion scattering with monolayer resolution In: Advances in Surface and Thin Film Diffraction : Symposium held in November 27-29, 1990, Boston, Massachusetts, U.S.A. /ed. T.C. Huang, P.I. Cohen and D.J. Eaglesham, Material Research Society, 1991. - pp. 199-202 |
