Structural relaxation in amorphous silicon and the role of network defects Back to all publications Publication date 1 January 1991 Reference S. Roorda, J.S. Custer, W.C. Sinke, J.M. Poate, D.C. Jacobson, A. Polman and F. Spaepen, Structural relaxation in amorphous silicon and the role of network defects, Nucl. Instrum. Methods Phys. Res., Sect B 59/60, 344-352 (1991) Group Photonic Materials Request this article
