| Reference |
I.V. Mitchell, W.N. Lennard and J.-B. Sanders: Quantitative microanalysis by heavy ion beam induced x-ray excitation In: Ion Beam Analysis : Proceedings of the Fourth International Conference on Ion Beam Analysis, Aarhus, June 25-29, 1979 /ed. H.H. Andersen, J. Bottiger and H. Knudsen, North-Holland, 1980. - pp. 121-123 |
