• J.R. Liefting, Engineering of damage in ion implanted silicon, University of Twente, 1992-06-18

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  • F.J. Bisschop, Characterisation and modeling of highly doped regions in silicon solar cells = Karakteriseren en modelleren van hoog gedoteerde gebieden in silicium zonnecellen, Utrecht University, 1992-06-16

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  • R. van Silfhout, Structure and morphology of static and growing Ge(111) surfaces, Leiden University, 1992-03-26

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  • J.H.M. Beijersbergen, Mode selective excitation and dissociation of polyatomic molecules, University of Amsterdam, UvA, 1992-01-14

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  • J.W.M. Frenken and B.J. Hinch: Quasielastic helium scattering studies of adatom diffusion on surfaces In: Helium Atom Scattering From Surfaces /ed. E. Hulpke, Cham: Springer, 1992. - pp. 287-313

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  • C. Norris, M.S. Finney, G.F. Clark, G. Baker, P.R. Moore and R. van Silfhout, Design and performance of a focused beam line for surface x-ray diffraction, Rev. Sci. Instrum. 63, 1083-1086 (1992)

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  • E.J. Puik, M.J. van der Wiel, H. Zeijlemaker and J. Verhoeven, Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited), Rev. Sci. Instrum. 63, 1415-1419 (1992)

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  • J.I. Siepmann, I.R. McDonald and D. Frenkel, Finite-size corrections to the chemical potential, J. Phys.: Condens. Matter 4, 679-691 (1992)

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  • M.A. van der Hoef, M. Dijkstra and D. Frenkel, Velocity autocorrelation function in a four-dimensional lattice gas, Europhys. Lett. 17, 39-43 (1992)

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  • R.L. Krans, C. Brands and W.C. Sinke, Kinetics of excimer-laser induced CVD of W, Appl. Surf. Sci. 54, 117-120 (1992)

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