F.J. Bisschop, Characterisation and modeling of highly doped regions in silicon solar cells = Karakteriseren en modelleren van hoog gedoteerde gebieden in silicium zonnecellen, Utrecht University, 1992-06-16
J.W.M. Frenken and B.J. Hinch: Quasielastic helium scattering studies of adatom diffusion on surfacesIn: Helium Atom Scattering From Surfaces /ed. E. Hulpke, Cham: Springer, 1992. - pp. 287-313
C. Norris, M.S. Finney, G.F. Clark, G. Baker, P.R. Moore and R. van Silfhout, Design and performance of a focused beam line for surface x-ray diffraction, Rev. Sci. Instrum. 63, 1083-1086 (1992)
E.J. Puik, M.J. van der Wiel, H. Zeijlemaker and J. Verhoeven, Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited), Rev. Sci. Instrum. 63, 1415-1419 (1992)