• J. Stauber, L. MacAleese, J. Franck, E. Claude, M. Snel, B. Kükrer-Kaletas, I.M. van der Wiel, M. Wisztorski, I. Fournier and R.M.A. Heeren, On-tissue protein identification and imaging by MALDI-ion mobility mass spectrometry, J. Am. Soc. Mass Spectrom. 21, (3), 338-347 (2010)

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  • J.J. Boon and E. Oberthaler: Mechanical weakness and paint reactivity observed in the paint structure and surface of The Art of Painting by Vermeer In: Vermeer, Die Malkunst – Spurensicherung an einem Meisterwerk : Ausstellungskatalog des Kunsthistorischen Museums Wien 2010 /ed. S. Haag, E. Oberthaler and S. Pénot, Residenz Verl., 2010. - pp. 328-335

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  • I.M. Taban Barbu, D.F. Smith, B. van Breukelen, Y.E.M. van der Burgt, M.C. Duursma, A.J.R. Heck, R.M.A. Heeren and J. Krijgsveld, On-the-fly targeted selection of labeled peptides in liquid chromatography/mass spectrometry based quantitative proteomics, Rapid Commun. Mass Spectrom. 24, (2), 239-241 (2010)

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  • R.L.A. Timmer, M.J. Cox and H.J. Bakker, Direct observation of proton transfer in ice Ih using femtosecond spectroscopy, J. Phys. Chem. A 114, (5), 2091-2101 (2010)

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  • V. Giannini, A. Berrier, St.A. Maier, J.A Sánchez-Gil and J. Gómez Rivas, Scattering efficiency and near field enhancement of active semiconductor plasmonic antennas at terahertz frequencies, Opt. Express 18, (3), 2797-2807 (2010)

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  • H. Arnolds and M. Bonn, Ultrafast surface vibrational dynamics, Surf. Sci. Rep. 65, (2), 45-66 (2010)

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  • A. Desai and A.M. Dogterom, Cell structure and dynamics, Curr. Opin. Cell Biol. 22, (1), 1-3 (2010)

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  • K. Takahashi, S. Tanase-Nicola and P.R. ten Wolde, Spatio-temporal correlations can drastically change the response of a MAPK pathway, PNAS 107, (6), 2473-2478 (2010)

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  • S.L. Diedenhofen and J. Gómez Rivas, Modified reflection in birefringent layers of core-shell semiconductor nanowires, Semicond. Sci. Technol. 25, (2, Article number: 24008), 1-5 (2010)

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  • L.A. Klerk, N. P. Lockyer, A.V. Kharchenko, L. MacAleese, P.Y.W. Dankers, J.C. Vickerman and R.M.A. Heeren, C60+ secondary ion microscopy using a delay line detector, Anal. Chem. 82, (3), 801-807 (2010)

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