• J.H. Jungmann, Active pixel detectors for Mass Spectrometry Imaging, Utrecht University, 2012-11-19

    Read more

  • M. Frimmer, Spontaneous emission near resonant optical antennas, University of Amsterdam UvA, 2012-11-14

    Read more

  • C. Blum, N. Zijlstra, A. Lagendijk, M. Wubs, A.P. Mosk, V. Subramaniam and W.L. Vos, Nanophotonic control of the Förster resonance energy transfer efficiency, Phys.Rev.Lett. 109, (20, Article number: 203601), 1-5 (2012)

    Read more

  • E.H.G. Backus, N. Garcia-Araez, M. Bonn and H.J. Bakker, On the role of Fresnel factors in sum-frequency generation spectroscopy of metal-water and metal-oxide-water interfaces, J. Phys. Chem. C 116, (44), 23351-23361 (2012)

    Read more

  • Jacopo Bertolotti, E.G. van Putten, C. Blum, A. Lagendijk, W.L. Vos and A.P. Mosk, Non-invasive imaging through opaque scattering layers, Nature 491, 232-234 (2012)

    Read more

  • St.D. Dimitrov, A.A. Bakulin, C.B. Nielsen, B.C. Schroeder, J. Du, Hugo Bronstein, H. Bronstein, I. McCulloch, R.H. Friend and R.D. Dupuis, On the energetic dependence of charge separation in low-band-gap polymer/fullerene blends, J. Am. Chem. Soc. 134, (44), 18189-18192 (2012)

    Read more

  • B. Cillero Pastor, G.B. Eijkel, A. Kiss, F.J. Blanco Garcia and R.M.A. Heeren, Time-of-flight secondary ion mass spectrometry-based maolcular distribution distinuishing healthy and osteoarthritic human cartilage, Anal. Chem. 84, (21), 8909-8916 (2012)

    Read more

  • K. Chughtai, Multimodal imaging of hypoxia in breast cancer, Utrecht University, 2012-11-05

    Read more

  • D.F. Smith, A.V. Kharchenko, M. Konijnenburg, I. Klinkert, Ljiljana Pasa-Tolic and R.M.A. Heeren, Advanced mass calibration and visualization for FT-ICR Mass Spectrometry Imaging, J. Am. Soc. Mass Spectrom. 23, (11), 1865-1872 (2012)

    Read more

  • J.H. Townsend and J.J. Boon: Research and instrumental analysis in the materials of easel paintings In: The Conservation of Easel Paintings /ed. J.H. Stoner and R. Rushfield, Routledge, 2012.

    Read more