Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam

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DOI http://dx.doi.org/10.1103/PhysRevB.82.195330
Reference G. Ctistis, A. Hartsuiker, E. van der Pol, J. Claudon, W.L. Vos and J.-M. Gérard, Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam, Phys. Rev. B 82, (Article number: 195330), 1-7 (2010)

We have performed white light reflectivity measurements on GaAs/AlAs micropillar cavities with diameters ranging from 1 μm up to 20 μm. We are able to resolve the spatial field distribution of each cavity mode in real space by scanning a small-sized beam across the top facet of each micropillar. We spectrally resolve distinct transverse-optical cavity modes in reflectivity. Using this procedure we can selectively address a single mode in the multimode micropillar cavity. Calculations for the coupling efficiency of a small-diameter beam to each mode are in very good agreement with our reflectivity measurements.