Nanoscopic control and quantification of enantioselective optical forces

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Publication date
DOI http://dx.doi.org/10.1038/NNANO.2017.180
Reference Y. Zhao, A.A.E. Saleh, M.A. van de Haar, B. Baum, J.A. Briggs, A. Lay, O.A. Reyes-Becerra and J.A. Dionne, Nanoscopic control and quantification of enantioselective optical forces, Nat. Nanotechnol. 12, (11), 1055-1060 (2017)
Group Photonic Materials

Circularly polarized light (CPL) exerts a force of different magnitude on left-and right-handed enantiomers, an effect that could be exploited for chiral resolution of chemical compounds(1-5) as well as controlled assembly of chiral nanostructures(6,7). However, enantioselective optical forces are challenging to control and quantify because their magnitude is extremely small (sub-piconewton) and varies in space with sub-micrometre resolution(2). Here, we report a technique to both strengthen and visualize these forces, using a chiral atomic force microscope probe coupled to a plasmonic optical tweezer(8-13). Illumination of the plasmonic tweezer with CPL exerts a force on the microscope tip that depends on the handedness of the light and the tip. In particular, for a left-handed chiral tip, transverse forces are attractive with left-CPL and repulsive with right-CPL. Additionally, total force differences between opposite-handed specimens exceed 10 pN. The microscope tip can map chiral forces with 2 nm lateral resolution, revealing a distinct spatial distribution of forces for each handedness.