| Reference |
R.M. Tromp, E.J. van Loenen, M. Iwami and F.W. Saris: Ion beam crystallography of the Si(111)-(7x7) and (1x1) surfaces In: Proceedings of the 16th International Conference on the Physics of Semiconductors, 6-10 September 1982, Montpellier, France ; Part II /ed. M. Averous, North-Holland, 1983. - pp. 779-780 |
