Improvements in surface preparation of paint cross-sections necessary for advanced imaging techniques

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Reference N. Wyplosz, R. Koper, J. van der Weerd, R.M.A. Heeren and J.J. Boon: Improvements in surface preparation of paint cross-sections necessary for advanced imaging techniques In: Art et Chimie, la Couleur: Actes du congrès /ed. J. Goupy and J.-P. Mohen, CNRS Editions, 2000. - pp. 65-68

A new polishing procedure is presented for the preparation of paint cross-sections with enhanced surface quality. As a result, chemical surface analysis by Fourier Transform Infrared (FTM) imaging spectroscopy and Laser Desorption lon Trap Mass Spectrometry (LDMS) is now possible. Surface quality is demonstrated by FTIR-imaging, Differential Interference Contrast (DIC) microscopy and Interferometric Profiling.