| Reference |
J.E. MacDonald, A.A. Williams, J.M.C. Thornton, R. van Silfhout, J.F. van der Veen, M.S. Finney and C. Norris: Grazing incidence X-ray diffraction studies of strain relaxation in monolayer-thick films In: Microscopy of Semiconducting Materials 1991 : Proceedings of the Institute of Physics Conference, held at Oxford University, 25-28 march 1991 /ed. A.G. Cullis and N.J. Long, Institute of Physics, 1991. - pp. 645-650 |
