Fine structure in the Er-related emission spectrum from Er-Si-O matrices at room temperature under carrier mediated excitation. Back to all publications Publication date 1 January 2003 DOI http://dx.doi.org/10.1016/s0022-2313(02)00648-8 Reference H. Isshiki, A. Polman and T. Kimura, Fine structure in the Er-related emission spectrum from Er-Si-O matrices at room temperature under carrier mediated excitation., J. Lumin. 102-103, 819-824 (2003) Group Photonic Materials Request this article
