Dopant segregation in silicon by pulsed-laser annealing: a test case for the concept of thermal melting Back to all publications Publication date 1 January 1979 Reference D. Hoonhout and F.W. Saris, Dopant segregation in silicon by pulsed-laser annealing: a test case for the concept of thermal melting, Phys. Lett. A 74, 253-255 (1979)
