Application of low energy ions to modify multilayer systems for omproved x-ray reflectivitiy

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Reference J. Verhoeven: Application of low energy ions to modify multilayer systems for omproved x-ray reflectivitiy In: Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems /ed. S. Chakraborty, Nova science publishers, 2002. - pp. 311-356

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