Hans Zeijlemaker

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Publications

  • Dolfine Kosters, Anouk de Hoogh, Hans Zeijlemaker, Hakki Acar, Nir Rotenberg and L. Kuipers, Core-shell plasmonic nanohelices, ACS Photonics 4, 7: 1858-1863 (2017)

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  • Sophie Meuret, Toon Coenen, Hans Zeijlemaker, Michael Latzel, Silke Christiansen, Sonia Conesa-Boj and Albert Polman, Photon bunching reveals single-electron cathodoluminescence excitation efficiency in InGaN quantum wells, Phys. Rev. B 96, 3: 035308: 1-8 (2017)

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  • Nuria Taberner, Andries Lof, Sophie Roth, Dimitry Lamers, Hans Zeijlemaker and Marileen Dogterom: In vitro systems for the study of microtubule-based cell polarity in fission yeast In: Building a cell from its component parts /ed. J. Ross and W. Marshall. - Amsterdam: Elsevier, 2015. - pp. 1-22 (Methods in Cell Biology; 128)

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  • B. le Feber, J. Cesario, H. Zeijlemaker, N. Rotenberg and L. Kuipers, Exploiting long-ranged order in quasiperiodic structures for broadband plasmonic excitation, Appl. Phys. Lett. 98, 20: 201108 1-4 (2011)

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  • H.J. Hopman, H. Alberda, I. Attema, H. Zeijlemaker and J. Verhoeven, Measuring the secondary electron emission characteristic of insulators, J. Electron Spectrosc. Relat. Phenom. 131-132, 51--60 (2003)

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  • H.J. Hopman, H. Zeijlemaker and J. Verhoeven, Secondary electron emission data of cesiated oxygen free high conductivity copper, II, Appl Surf. Sci. 171, 197--206 (2001)

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  • B.L.M. Hendriksen, G.S. Verhoeven, E. de Kuyper, L. Crama, J.W.M. Frenken, P.B. Rasmussen, H. Zeijlemaker, W. Barsingerhorn and H.G. Ficke, Hoge druk scanning tunneling microscopie voor katalytisch onderzoek: Ontwikkeling en prestaties van de "reactor-STM", Nevacblad 38, 5--9 (2000)

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  • P.B. Rasmussen, B.L.M. Hendriksen, H. Zeijlemaker, H.G. Ficke and J.W.M. Frenken, The "Reactor-STM": A scanning tunneling microscope for investigation of catalytic surfaces at semi-industrial reaction conditions, Rev. Sci. Instrum. 69, 3879-3884 (1998)

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  • M.S. Hoogeman, D. Glastra van Loon, R.W.M. Loos, H.G. Ficke, E. de Haas, J.J. van der Linden, H. Zeijlemaker, L. Kuipers, M.F. Chang, M.A.J. Klik and J.W.M. Frenken, Design and performance of a programmable-temperature scanning tunneling microscope, Rev. Sci. Instrum. 69, 2072-2080 (1998)

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  • E.J. Puik, M.J. van der Wiel, H. Zeijlemaker and J. Verhoeven, Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited), Rev. Sci. Instrum. 63, 1415-1419 (1992)

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