Veeco Dimension 3100 AFM
Atomic Force Microscopy (AFM) is a high resolution scanning probe microscope with resolution on the order of sub nanometer. The AFM consist of a cantilever with a sharp tip used to scan the surface of a sample.
Specifications
- Veeco Dimension 3100 AFM
- Sample size 150 mm diameter 12 mm thick
- Stage movement x-y 150 mm with 2 micron resolution
- Video optics with zoom 150-675 micron viewing area
- Piezo scan head range; 90 micron x-y and 6 micron in z
- 16 bits DAC giving sub nanometer resolution
- Max 512 x 512 samples/image
- Contact and tapping mode AFM
- Conductive AFM
- STM
- Liquid cell