Johan Derks

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  • Willem Jan Huisman, J.F. Peters, J.W. Derks, H.G. Ficke, D.L. Abernathy and J.F. van der Veen, A new X-ray diffraction method for structural investigations of solid-liquid interfaces, Rev. Sci. Instrum. 68, 4169-4176 (1997)

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  • P.M.J. Maree, A.P. de Jongh, J.W. Derks and J.F. van der Veen, A system for MBE growth and high-resolution RBS analysis, Nucl. Instrum. Methods Phys. Res. B 28, 76-81 (1987)

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